DocumentCode :
2878592
Title :
A 3D Stacked Memory Integrated on a Logic Device Using SMAFTI Technology
Author :
Kurita, Yoichiro ; Matsui, Satoshi ; Takahashi, Nobuaki ; Soejima, Koji ; Komuro, Masahiro ; Itou, Makoto ; Kakegawa, Chika ; Kawano, Masaya ; Egawa, Yoshimi ; Saeki, Yoshihiro ; Kikuchi, Hidekazu ; Kato, Osamu ; Yanagisawa, Azusa ; Mitsuhashi, Toshiro ;
Author_Institution :
NEC Electron., Kawasaki
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
821
Lastpage :
829
Abstract :
A general-purpose 3D-LSI platform technology for a high-capacity stacked memory integrated on a logic device was developed for high-performance, power-efficient, and scalable computing. SMAFTI technology, featuring an ultra-thin organic interposer with high-density feedthrough conductive vias, was introduced for interconnecting the 3D stacked memory and the logic device. A DRAM-compatible manufacturing process was realized through the use of a "via-first" process and highly doped poly-Si through-silicon-vias (TSVs) for vertical traces inside memory dice. A multilayer ultra-thin die stacking process using micro-bump interconnection technology was developed, and Sn-Ag/Cu pillar bumps and Au/Ni backside bumps for memory dice were used for this technology. The vertical integration of stacked DRAM with TSVs and a logic device in a BGA package has been successfully achieved, and actual device operation has been demonstrated for the first time as a 3D-LSI with the DRAM introducing TSVs on the logic device.
Keywords :
CMOS logic circuits; DRAM chips; ball grid arrays; copper alloys; elemental semiconductors; gold alloys; integrated circuit interconnections; integrated circuit packaging; large scale integration; multilayers; nickel alloys; silicon; silver alloys; tin alloys; 3D-LSI platform technology; Au-Ni; BGA package; DRAM-compatible manufacturing process; SMAFTI technology; SMArt connection with Feed-Through Interposer technology; SnAgCu; backside bumps; high-capacity stacked memory integration; high-density feedthrough conductive vias; highly doped poly-silicon through-silicon-vias; logic device; microbump interconnection technology; multilayer ultra-thin die stacking process; pillar bumps; ultra-thin organic interposer; Energy consumption; Logic devices; Packaging; Random access memory; Resins; Silicon; Stacking; Through-silicon vias; Wafer bonding; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.373893
Filename :
4249979
Link To Document :
بازگشت