Title :
Beam trip event diagnostics for the TLS
Author :
Hu, K.H. ; Wu, C.Y. ; Chen, Jenny ; Kuo, C.H. ; Hsu, K.T.
Author_Institution :
Nat. Synchrotron Radiat. Res. Center, Hsinchu
Abstract :
Analyzing the reasons of various trip events is essential for improvement of system reliability. To identity the causes of trip at Taiwan light source (TLS), various diagnostics tool were employed. These diagnostic tools can capture beam trip, interlock signals of superconducting RF system, waveform of the injection kickers, quench and interlock signals of the superconducting insertion device, and instability signals of the stored beam. These diagnostics can be routine monitor signal and record beam trip event. Features of trip diagnostic tools are available now and future plan will be summarized in this report.
Keywords :
accelerator RF systems; particle beam diagnostics; synchrotrons; wigglers; TLS; Taiwan light source; beam trip event diagnostics; superconducting RF system; superconducting insertion device; superconducting wiggler; synchrotron light source; Control systems; Electron beams; Light sources; Oscilloscopes; RF signals; Radio frequency; Signal resolution; Superconducting devices; Superconducting magnets; Temperature control;
Conference_Titel :
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0916-7
DOI :
10.1109/PAC.2007.4439991
