Title :
A subnanosecond HEMT 1Kb SRAM
Author :
Nishiuchi, K. ; Kobayashi, Nao ; Kuroda, Sho ; Notomi, S. ; Nimura, Tomohiro ; Abe, Makoto ; Kobayashi, Masato
Author_Institution :
Fujitsu Labs., Ltd., Atsugi, Japan
Keywords :
Capacitance; Gallium arsenide; HEMTs; Large scale integration; MODFETs; Random access memory; Read-write memory; Semiconductor device measurement; Size measurement; Switching circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156594