Title :
A 70ns 256K DRAM with bitline shielding structure
Author :
Mashiko, K. ; Kobayashi, Takehiko ; Wakamiya, W. ; Hatanaka, M. ; Yamada, Makoto
Author_Institution :
Mitsubishi LSI Res. and Dev. Lab., Itami-shi, Japan
Keywords :
Bonding; Capacitance; Circuits; Fuses; Laser modes; Pins; Preamplifiers; Random access memory; Timing; Wire;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156599
