DocumentCode
2878856
Title
A programmable 256K CMOS EPROM with on-chip test circuits
Author
Tanaka, Shoji ; Atsumi, S. ; Momodomi, M. ; Shinada, K. ; Yoshikawa, Kenichi ; Nagakubo, Y. ; Kanzaki, K.
Author_Institution
Toshiba Semiconductor Device Engineering Lab, Kawasaki, Japan
Volume
XXVII
fYear
1984
fDate
22-24 Feb. 1984
Firstpage
148
Lastpage
149
Keywords
CMOS technology; Circuit testing; EPROM; Energy consumption; Laboratories; Power engineering and energy; Semiconductor devices; Stress control; Threshold voltage; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1984.1156605
Filename
1156605
Link To Document