Title : 
Characterization of the bistatic scattered distribution
         
        
            Author : 
Daout, F. ; Schmitt, F.
         
        
            Author_Institution : 
Groupe de Traitement du Signal, Ecole Navale Batiment des Labs., Brest Naval, France
         
        
        
        
        
        
            Abstract : 
The bistatic scattering from a rough surface is simulated by a computer program for a wide angles range. The effect of shadowing and multiple scattering are taken into account. To describe the scattered field the Kirchhoff theory is used. The probability density functions (pdf) of normalized scattering pressure (modulus) are compared with the Weibull, lognormal and K-distribution pdf. The phase distribution are also studied. The values of the distribution parameters estimated using maximum likelihood (ML) estimators are obtained. The Kolmogorov-Smirnov goodness of fit test is used to determine which of the distribution fits the data better. It is observed that the effect of the size of the illuminated area is important on the phase distribution
         
        
            Keywords : 
geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; rough surfaces; terrain mapping; K-distribution; Kirchhoff theory; Kolmogorov-Smirnov goodness of fit test; Weibull distribution; bistatic radar; bistatic scattered distribution; bistatic scattering; geophysical measurement technique; land surface; lognormal distribution; maximum likelihood estimator; model; multiple scattering; normalized scattering pressure; phase distribution; probability density function; radar remote sensing; radar scattering; rough surface; shadowing; simulation; terrain mapping; Computational modeling; Computer simulation; Maximum likelihood estimation; Parameter estimation; Probability density function; Rough surfaces; Scattering; Shadow mapping; Surface roughness; Testing;
         
        
        
        
            Conference_Titel : 
Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
         
        
            Conference_Location : 
Hamburg
         
        
            Print_ISBN : 
0-7803-5207-6
         
        
        
            DOI : 
10.1109/IGARSS.1999.771638