Title :
High-Performance Millimeter-Wave SOP Technology with Flip-Chip Interconnection
Author :
Song, Sangsub ; Maeng, Jimin ; Lee, Heeseok ; Seo, Kwang-Seok
Author_Institution :
Seoul Nat. Univ., Seoul
fDate :
May 29 2007-June 1 2007
Abstract :
In this paper, we demonstrate the development of the system-on-package (SOP) technology using the SNU´s deposited multi-chip module (MCM-D) technology for compact and high-performance millimeter-wave (mm-wave) modules. A distinctive feature of our MCM-D technology is the existence of Si-bumps and ground-bumps. The Si-bumps having a low coefficient of thermal expansion (CTE) and a high thermal conductivity can solve thermal and thermo-mechanical problems of the flip-chip structure. And the ground-bumps can make easy ground connection without deep-via process. From thermal analysis using a three-dimensional (3-D) finite element method (FEM) simulator, we confirmed that the proposed substrate has the significantly improved thermal performance. And the integrated passives such as the SiNx capacitor, the NiCr resistor, and the broadside Lange coupler were fabricated and characterized for SOP technology. Especially port terminator was optimized to provide a good match so that the reflection of microwave power is minimized. The flip-chip transition between the thin-film microstrip (TFMS) line and the coplanar waveguide (CPW) line on the flipped chip is also optimized for mm-wave range. As an illustration of this implementation methodology, a W-band transmitter was realized on the SNU´s MCM-D substrate by means of the flip-chip technology. And the MCM-D substrate was fabricated for a mm-wave power amplifier (PA) module.
Keywords :
chip scale packaging; coplanar waveguides; finite element analysis; flip-chip devices; microstrip transitions; millimetre wave power amplifiers; multichip modules; system-on-chip; thermal analysis; thermal conductivity; thermal expansion; FEM simulator; W-band transmitter; coefficient of thermal expansion; coplanar waveguide line; flip-chip interconnection; flip-chip structure; ground bumps; high-performance millimeter-wave SOP technology; integrated passives; mm-wave power amplifier module; multichip module technology; silicon bumps; system-on-package technology; thermal conductivity; thermo-mechanical problems; thin-film microstrip line; three-dimensional finite element method; Analytical models; Coplanar waveguides; Finite element methods; Millimeter wave technology; Performance analysis; Silicon compounds; Substrates; Thermal conductivity; Thermal expansion; Thermomechanical processes;
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2007.373920