DocumentCode :
2879154
Title :
Experimental and Numerical Study of the Effect of Viscoelasticity on Delamination in a Plastic IC Package
Author :
Guojun, Hu ; Tay, Andrew A O ; Yongwei, Zhang ; Chew, Spencer
Author_Institution :
Cookson Semicond. Packaging Mater., Singapore
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1062
Lastpage :
1068
Abstract :
Over the glass transition temperature, epoxy molding compound strongly exhibits viscoelastic behavior which causes its Young´s modulus to be not only temperature-dependent but also time-dependent. In the present study, the viscoelastic properties of epoxy molding compound such as Prony coefficients, relaxation time and time-temperature shift factors are used for the delamination analysis. At the same time, end-notched flexure tests have been conducted at high temperatures under different loading rates for the investigation of the effect of viscoelasticity on the interface delamination between epoxy molding compound and copper. It is found that the energy release rate can still be a criterion for the viscoelastic bimaterial interface crack problem during lead-free solder reflow process. Furthermore, the critical energy release rate is rate-dependent and usually the critical energy release rate increases with the increase of loading rate for the interface delamination between epoxy molding compound and copper.
Keywords :
Young´s modulus; delamination; glass transition; integrated circuit packaging; reflow soldering; solders; viscoelasticity; Prony coefficients; Young modulus; delamination analysis; end-notched flexure tests; energy release rate; epoxy molding compound; glass transition temperature; lead-free solder reflow process; plastic IC package delamination; viscoelastic bimaterial interface crack problem; Copper; Delamination; Elasticity; Environmentally friendly manufacturing techniques; Glass; Lead; Plastic integrated circuit packaging; Temperature; Testing; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.373929
Filename :
4250015
Link To Document :
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