A solution of correspondence problem for measuring 3D surface

This paper deals with the correspondence problem of two grabbed images, obtained by projecting a structured light on the measuring surface, when 3D information of a given surface is needed. In our system, the constraint that codifies the pattern projected on the surface has been simplified by using a random speckle pattern, thus the correspondence problem is reduced to the local matching between two grabbed images and solved by a spatial distance computation technique. Experiments have shown the feasibility of the proposed method.