DocumentCode
2879306
Title
NiosII Soft-Core Processor Implementation in the Moving Controlling System of ESD Pole
Author
Wenbing, Liu ; Shanghe, Liu ; Liang, Yuan
Author_Institution
Inst. of Electrostatic & Electromagn. Protection, Mech. Eng. Coll.
fYear
2006
fDate
1-4 Aug. 2006
Firstpage
289
Lastpage
292
Abstract
In dealing with the frequently happened problem of partially failure in the common VLSI chips under strong EMI environment, a method of the hardening of the logic core for the controlling system is offered based on NiosII soft-core technology. This method both improved fundamentally the normal used protecting methods for the traditional control systems, and structurally enhanced the reliability of the control system under ESD environment
Keywords
VLSI; electrical engineering computing; electromagnetic interference; electrostatic discharge; hardware-software codesign; EMI; ESD pole; NiosII soft-core processor; VLSI chips; Concrete; Control systems; Electromagnetic interference; Electrostatic discharge; Field programmable gate arrays; Immunity testing; Logic devices; Logic programming; Protection; Pulse width modulation; EMI; ESD; FPGA; Moving Controlling System; NiosII Soft-Core Processor;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Electromagnetics, The 2006 4th Asia-Pacific Conference on
Conference_Location
Dalian
Print_ISBN
1-4244-0183-6
Type
conf
DOI
10.1109/CEEM.2006.257955
Filename
4027287
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