DocumentCode
2879308
Title
Use of E-beam for random access read and write of digital test signals
Author
Jensen, Jens ; Martin, Ken
Author_Institution
Univ. of California at Los Angeles, Los Angeles, CA, USA
Volume
XXVII
fYear
1984
fDate
22-24 Feb. 1984
Firstpage
22
Lastpage
23
Abstract
An E-beam that was used both to inject and read digital signals for diagnostic test of NMOS and CMOS ICs will be discussed. E-beam programmable master-slave flip-flops, which add less than 0.25pF circuit load, were included for signal injection purposes.
Keywords
Circuit testing; Debugging; Degradation; Diodes; Electrons; Integrated circuit testing; MOS devices; Registers; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1984.1156632
Filename
1156632
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