Title :
Problem of functional test synthesis in information systems for cad/cae
Author :
Sharshunov, S.G. ; Nikulov, S.V.
Author_Institution :
Far Eastern State Technical University, Russia
Keywords :
Circuit faults; Circuit synthesis; Circuit testing; Communication system control; Computer aided engineering; Design automation; Information systems; Microprocessors; Registers; System testing;
Conference_Titel :
Application of the Conversion Research Results for International Cooperation, 1999. SIBCONVERS '99. The Third International Symposium
Print_ISBN :
0-7803-5172-X
DOI :
10.1109/SIBCON.1999.771658
