Author :
Mitchell, Chester ; Dierker, Jeffrey A. ; Keyarts, Gene
Author_Institution :
F. W. Bell, Inc., Columbus, Ohio
Abstract :
In almost every physical phenomenon that can be defined by electrical parameters, there is more intelligence in current than in voltage measurements. Lacking technology in non-contact current sensing, historical developments have resulted in instruments and accessories for current measurement that require insertion in the circuit and are often difficult, dangerous and circuit-degrading in their application. Because of these drawbacks, less desirable voltage-drop circuit analysis has become wide-spread. Advantages and disadvantages of present technology are investigated and compared to recent developments in current sensing, utilizing Hall-effect devices which offer safe, accurate, reliable and non-contacting measurement of ac, dc and composite currents.
Keywords :
Circuits; Current measurement; Electric variables measurement; Electrical resistance measurement; Impedance; Instruments; Magnetic field measurement; Shunt (electrical); Voltage; Wire;
Conference_Titel :
Telephone Energy Conference, 1978. INTELEC '78. International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/INTLEC.1978.4793569