Title :
Session 11 scaling and performance aspects of technology [breaker page]
Author_Institution :
IBM Corporation, Essex Junction, VT, USA
Abstract :
Start of the above-titled section of the conference proceedings record.
Keywords :
Scaling and performance aspects of technology;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156659
