DocumentCode :
2879800
Title :
Design and implementation of an electron and positron multibunch turn-by-turn vertical beam profile monitor in CESR
Author :
Palmer, M. ; Dobbins, J. ; Hartill, D. ; Strohman, C. ; Tanke, E. ; Holtzapple, R. ; Cerio, B. ; Kern, J. ; Watkins, M.
Author_Institution :
Cornell Lab. for Accel. - Based Sci. & Educ., Ithaca
fYear :
2007
fDate :
25-29 June 2007
Firstpage :
4081
Lastpage :
4083
Abstract :
Two fast vertical beam profile monitors have been implemented at the Cornell electron storage ring (CESR); one is dedicated to electrons, the other to positrons. They are being used to probe a range of single bunch and multi-bunch beam dynamics issues as well as machine stability issues. Readout is based on the Hamamatsu H7260K multi-anode photomultiplier [1]. This device has a 32 channel linear anode array with 1 mm channel pitch and sub-nanosecond rise time. A custom 72 MHz digitizer unit allows synchronous multi- bunch and turn-by-turn data acquisition of the 14 ns spaced bunches in CESR. An on-board digital signal processor provides local data processing capability. This paper describes the profile monitor hardware, data acquisition system, and data analysis software.
Keywords :
beam handling techniques; electron accelerators; field programmable gate arrays; particle beam bunching; physics computing; readout electronics; software packages; storage rings; synchrotron radiation; 32 channel linear anode array; CESR; Cornell Electron Storage Ring; FPGA; beam dynamics; data acquisition system; data analysis software; data processing capability; digital signal processor; electron multibunch; frequency 72 MHz; positron multibunch; profile monitor hardware; readout electronics; sub-nanosecond rise time; synchronous multibunch; turn-by-turn vertical beam profile monitor; Anodes; Data acquisition; Digital signal processors; Electron beams; Monitoring; Photomultipliers; Positrons; Probes; Stability; Storage rings;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0916-7
Type :
conf
DOI :
10.1109/PAC.2007.4440057
Filename :
4440057
Link To Document :
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