DocumentCode :
2880000
Title :
In-situ Characterization of Moisture Absorption and Desorption in a Thin BT Core Substrate
Author :
He, Yi ; Fan, Xuejun
Author_Institution :
Intel Corp., Chandler
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1375
Lastpage :
1383
Abstract :
Bismaleimide-triazine (BT) resin/glass fiber laminates are commonly used as a substrate core material in microelectronic packaging. Their moisture absorption and diffusion behavior have a significant impact on package reliability. The traditional method to determine moisture absorption relies on a weight gain measurement metrology with an analytical balance. This approach is generally not suitable for thin films. In this study, the moisture absorption-desorption behavior of a thin BT core was characterized in-situ using a sorption TGA over a temperature range of 30 to 80degC, in an environment of up to 80% relative humidity. From the experimental results, the moisture diffusivity and the saturated moisture content have been determined. Within the experimental temperature range, the diffusivity can be described by the Arrhenius equation and the activation energy can be computed. The obtained results are compared with literature data. The impact of moisture diffusion in BT core on the reliability of ultra-thin stacked chip scale packages (UT/SCSP) will be discussed.
Keywords :
absorption; chip scale packaging; desorption; diffusion; glass fibres; integrated circuit measurement; integrated circuit reliability; moisture; resins; Arrhenius equation; BT core substrate; TGA; UT-SCSP reliability; activation energy; bismaleimide-triazine resin/glass fiber laminates; in-situ characterization; microelectronic packaging; moisture absorption; moisture desorption; moisture diffusion; moisture diffusivity; temperature 30 C to 80 C; ultrathin stacked chip scale package; weight gain measurement metrology; Absorption; Gain measurement; Glass; Laminates; Metrology; Microelectronics; Moisture; Packaging; Resins; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.373974
Filename :
4250060
Link To Document :
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