DocumentCode :
2880283
Title :
[Copyright notice]
fYear :
2010
fDate :
3-8 Oct. 2010
Firstpage :
1
Lastpage :
1
Abstract :
The following topics are dealt with: ESD protection; CMOS; CDM related factory issues; bipolar devices; smart power devices; RF devices; device testing; and MEMS.
Keywords :
CMOS integrated circuits; electrostatic discharge; micromechanical devices; power integrated circuits; testing; CDM related factory issues; CMOS; ESD protection; MEMS; RF devices; bipolar devices; device testing; smart power devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd
Conference_Location :
Reno, NV
Print_ISBN :
978-1-58537-182-2
Type :
conf
Filename :
5623727
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2880283
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