Title :
Physical limits of VLSI DRAMs
Author :
Lewyn, L. ; Meindl, J.
Author_Institution :
Stanford University, Stanford, CA
Abstract :
This paper will report on a study disclosing real constraints affecting DRAM limits, including soft errors, cosmic rays, α particles, noise limitations and critical fields. Density limits of 16Mb are projected.
Keywords :
Art; Circuit noise; Cosmic rays; Dielectrics; Insulation; Low voltage; Noise cancellation; Power dissipation; Random access memory; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156713
