DocumentCode :
2880778
Title :
A Novel Approach for System Level Package Modeling to Address Signal and Power Integrity Issues
Author :
Wei, X.C. ; Liu, E.X. ; Oo, Z.Z. ; Li, E.P. ; Vahldieck, R.
Author_Institution :
Inst. of High Performance Comput., Singapore
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1653
Lastpage :
1658
Abstract :
The electromagnetic compatibility simulation of the power delivery network inside the integrated circuit packaging becomes an important issue in the modern circuit design. In this paper, this complex power-ground plane is divided into the internal region and external region. These two regions are simulated by using the hybrid integral equations. The internal integral equation is described by using the rectangular cavity dyadic green functions, while the external integral equation is described by using the free-space green function. These two equations are coupled through the equivalent magnetic current placed on the periphery and gaps of the power-ground plane. This proposed method could accurately simulate both the coupling between vias inside the power-ground plane and the emission from the periphery and gaps of the power-ground plane. Through several examples, its accuracy and efficiency are validated.
Keywords :
Green´s function methods; electromagnetic compatibility; integrated circuit design; system-in-package; address signal; circuit design; complex power-ground plane; dyadic green functions; electromagnetic compatibility; hybrid integral equations; integrated circuit packaging; magnetic current; power delivery network; power integrity; rectangular cavity; system level package modeling; Circuit simulation; Conductors; Electromagnetic compatibility; Green function; Impedance; Integral equations; Integrated circuit packaging; Integrated circuit technology; Power system modeling; Semiconductor device packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.374016
Filename :
4250102
Link To Document :
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