DocumentCode
2880796
Title
Performance limits of NMOS and CMOS
Author
Pfiester, J. ; Shott, J. ; Meindl, J.
Author_Institution
Stanford University, Stanford, CA
Volume
XXVII
fYear
1984
fDate
22-24 Feb. 1984
Firstpage
158
Lastpage
159
Abstract
An analytic MOST model to project circuit performance limits will be reported. Minimum channel lengths of 0.14 and 0.40μm, corresponding to logic gate delays of 19ps for CMOS and 103ps for NMOS are predicted.
Keywords
CMOS technology; Circuits; Dynamic voltage scaling; Electron devices; MOS devices; Paper technology; Semiconductor device modeling; Switches; Threshold voltage; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1984.1156715
Filename
1156715
Link To Document