Title :
A 2.3ns access time 4K ECL RAM
Author :
Tokuyoshi, F. ; Takemura, Hiroshi ; Tashiro, Takayoshi ; Ohi, Shoichi ; Shiraki, H. ; Nakamae, M. ; Kubota, Takahide ; Nakamura, T.
Author_Institution :
NEC Corp., Kanagawa, Japan
Abstract :
A poly load 28.0mm264K×1 SRAM with a 35ns access time has been developed using 1.5μm double TaSi P-well CMOS technology.
Keywords :
Added delay; Boron; Capacitance; Decoding; Delay estimation; Driver circuits; Epitaxial layers; Random access memory; Read-write memory; Resistors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1984 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1984.1156717