DocumentCode :
2880956
Title :
Assessment of Fluxless Solid Liquid Interdiffusion Bonding by Compressive Force of Au-PbSn and Au-SAC for Flip Chip Packaging
Author :
Lee, Teck Kheng ; Zhang, Sam ; Wong, C.C. ; Tan, A.C.
Author_Institution :
Micron Semiconductor Asia Pte Ltd., Singapore
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1701
Lastpage :
1706
Abstract :
Flip chip packaging faces two primary bonding-process obstacles: flux use and geometry mismatch between die and substrate pad pitch. These obstacles motivated the development of a fluxless bonding method called solid-liquid interdiffusion bonding by compressive force (SLICF). SLICF utilizes a mechanical force to form the bond through solid-liquid interdiffusion with a joint-in-via (JIV) architecture for flip chip packaging. SLICF bonding (also known as Thermo-mechanical (TM) bonding) forms an instantaneous bond and eliminates the need for reflow infrastructure. Both Au-PbSn and Au-SAC interconnect systems were studied for the SLICF bonding on the JIV architecture at a 130 mum pitch. The morphologies of Au-PbSn and Au-SAC in solid-liquid interdiffusion were studied with their kinetics measured by the Au consumption rate. The SLIFC bonds for Au-PbSn and Au-SAC were compared and assessed by mechanical shear tests and thermomechanical stresses. Au with PbSn was found to perform marginally better due to its joint geometry and slower kinetics.
Keywords :
diffusion bonding; flip-chip devices; gold alloys; integrated circuit interconnections; lead alloys; reflow soldering; tin alloys; AuPbSn; bonding-process; compressive force; flip chip packaging; fluxless bonding; interconnect systems; joint-in-via architecture; mechanical force; mechanical shear tests; reflow; solid liquid interdiffusion bonding; thermo-mechanical bonding; thermomechanical stresses; Bonding forces; Flip chip; Geometry; Gold; Kinetic theory; Morphology; Packaging; Solids; Testing; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.374024
Filename :
4250110
Link To Document :
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