DocumentCode
2880956
Title
Assessment of Fluxless Solid Liquid Interdiffusion Bonding by Compressive Force of Au-PbSn and Au-SAC for Flip Chip Packaging
Author
Lee, Teck Kheng ; Zhang, Sam ; Wong, C.C. ; Tan, A.C.
Author_Institution
Micron Semiconductor Asia Pte Ltd., Singapore
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
1701
Lastpage
1706
Abstract
Flip chip packaging faces two primary bonding-process obstacles: flux use and geometry mismatch between die and substrate pad pitch. These obstacles motivated the development of a fluxless bonding method called solid-liquid interdiffusion bonding by compressive force (SLICF). SLICF utilizes a mechanical force to form the bond through solid-liquid interdiffusion with a joint-in-via (JIV) architecture for flip chip packaging. SLICF bonding (also known as Thermo-mechanical (TM) bonding) forms an instantaneous bond and eliminates the need for reflow infrastructure. Both Au-PbSn and Au-SAC interconnect systems were studied for the SLICF bonding on the JIV architecture at a 130 mum pitch. The morphologies of Au-PbSn and Au-SAC in solid-liquid interdiffusion were studied with their kinetics measured by the Au consumption rate. The SLIFC bonds for Au-PbSn and Au-SAC were compared and assessed by mechanical shear tests and thermomechanical stresses. Au with PbSn was found to perform marginally better due to its joint geometry and slower kinetics.
Keywords
diffusion bonding; flip-chip devices; gold alloys; integrated circuit interconnections; lead alloys; reflow soldering; tin alloys; AuPbSn; bonding-process; compressive force; flip chip packaging; fluxless bonding; interconnect systems; joint-in-via architecture; mechanical force; mechanical shear tests; reflow; solid liquid interdiffusion bonding; thermo-mechanical bonding; thermomechanical stresses; Bonding forces; Flip chip; Geometry; Gold; Kinetic theory; Morphology; Packaging; Solids; Testing; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.374024
Filename
4250110
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