• DocumentCode
    2880976
  • Title

    Adhesion and Reliability of Anisotropic Conductive Films (ACFs) Joints on Organic Solderability Preservatives (OSPs) Metal Surface Finish

  • Author

    Kim, Hyoung-Joon ; Paik, Kyung-Wook

  • Author_Institution
    Korea Adv. Inst. of Sci. & Technol., Daejeon
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    1707
  • Lastpage
    1713
  • Abstract
    The effect of final metal finishes of Cu electrodes on the adhesion and reliability of anisotropic conductive film (ACF) joints was investigated. Two different metal surface finishes, electroless Ni/immersion Au (ENIG) and organic solderability preservatives (OSPs) coated on Cu, were selected in this study. These are commonly used as final metal finish materials in the printed circuit board (PCB) industry. However, the effect of OSPs coated on Cu on the adhesion and reliability of ACF joints has not been studied yet. Therefore, the adhesion and reliability of ACF/OSP joints were investigated. The results of ACF/OSP joints were compared with those of ACF/ENIG joints to evaluate the feasibility of ACF/OSP joints in real packaging applications. For electrical continuity and reliability tests, patterned flexible substrates and FR4 rigid substrates were prepared. A flexible substrate was bonded to two types of organic FR4 substrates with different metal surface finishes, ENIG and OSP, using ACFs. According to the result of contact resistance measurement, the initial contact resistances of the ACF/OSP joints, approximately 15 mOmega, were almost the same as those of the ACF/ENIG joints. For the reliability test, a pressure cooker test (PCT) was performed in order to verify the stability of the ACF/OSP joints in high temperature and humid environments. According to the results of PCT, ACF/OSP joints showed better reliability compared to ACF/ENIG joints. The adhesion strength of ACF/OSP joints was higher than that of ACF/bare Cu and ACF/ENIG joints. The fracture site of the ACF/bare Cu and ACF/ENIG joints was the ACF/metal interface, while that of ACF/OSP joints was inside the ACF. TEM and FT-IR analyses showed that the OSP coating layer on the Cu electrodes remained after ACF bonding, and OSP layer acted as an adhesion promoter to ACFs.
  • Keywords
    circuit reliability; conductive adhesives; electronic equipment testing; printed circuits; surface finishing; adhesion; anisotropic conductive films; electroless Ni/immersion Au; metal surface finish; organic solderability preservatives; pressure cooker test; printed circuit board; reliability; Adhesives; Anisotropic conductive films; Bonding; Conducting materials; Electrodes; Gold; Inorganic materials; Substrates; Surface finishing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.374025
  • Filename
    4250111