• DocumentCode
    2881016
  • Title

    Effects of Heating Rate During ACFs Curing Process on Material Properties and Thermal Cycling Reliability of Flip Chip Assembly

  • Author

    Jang, Kyung-Woon ; Paik, Kyung-Wook

  • Author_Institution
    Korea Adv. Inst. of Sci. & Technol., Daejeon
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    1725
  • Lastpage
    1730
  • Abstract
    In this study, effects of heating rate during ACF curing processes on material properties such as thermo-mechanical properties and rheological properties of ACFs were investigated. Generally, material properties of polymers change with the process conditions such as temperature, time, frequency, and so on. As the heating rate increased, coefficient of thermal expansion (CTE) of ACFs increased, and storage modulus and glass transition temperature (Tg) of ACFs decreased. ACF material property changes were due to cross-linking density which is related with ACFs density. Contact resistance of ACFs flip chip assembly was dependent on heating rates. As the heating rate increased, the contact resistances of ACFs flip chip assemblies decreased. The decrease in contact resistance was due to larger ACFs conductive particle deformation. In addition, effects of heating rates of ACFs on thermal cycling (T/C) reliability of flip chip assemblies were also investigated. As the heating rate increased, the contact resistances of ACF flip chip assemblies rapidly increased during the T/C test. T/C reliability test result was analyzed by the shear strain estimation which is closely related with ACFs material properties and the gap between a chip bump and a substrate pad. As a summary, effects of heating rate on ACFs material properties and thermal cycling reliability were investigated. T/C reliability test result was analyzed in terms of the shear strain. Based on the results, the guidelines of ACFs curing process during flip chip bonding processes were suggested.
  • Keywords
    assembling; bonding processes; contact resistance; curing; flip-chip devices; heating; reliability; thermal expansion; ACF curing; anisotropically conductive film; contact resistance; flip chip assembly; flip chip bonding; heating rate; thermal cycling reliability; thermal expansion; Assembly; Capacitive sensors; Contact resistance; Curing; Flip chip; Material properties; Materials reliability; Resistance heating; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.374028
  • Filename
    4250114