Title :
Effect of thin film module geometry on solar cell current-voltage analysis
Author :
Eisgruber, I.L. ; Sites, J.R.
Author_Institution :
Colorado State Univ., Fort Collins, CO, USA
Abstract :
Extraction of diode quality factor and series resistance from current-voltage data may be complicated by voltage drops across the transparent conducting oxide. The effect of the voltage drops on I-V analysis is negligible for small solar cells, but becomes important for larger cells such as those found in thin-film modules. Agreement between predicted and measured voltage drops is demonstrated. Numerical results are presented for both CdTe and CuInSe2 solar cells
Keywords :
II-VI semiconductors; cadmium compounds; copper compounds; electric current measurement; indium compounds; semiconductor device models; semiconductor device testing; semiconductor thin films; solar cell arrays; solar cells; ternary semiconductors; voltage measurement; CdTe; CuInSe2; I-V characteristics; current-voltage analysis; numerical results; solar cells; thin film module geometry; transparent conducting oxide; voltage drops; Current-voltage characteristics; Data mining; Diodes; Electrical resistance measurement; Geometry; Photovoltaic cells; Q factor; Surface resistance; Transistors; Voltage;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.519860
