Title :
Power hardware-in-the-loop: A value proposition for early stage prototype testing
Author :
Steurer, Michael ; Meeker, Richard ; Schoder, Karl ; McLaren, Peter
Author_Institution :
Center for Adv. Power Syst., Florida State Univ., Tallahassee, FL, USA
Abstract :
This paper describes advanced power hardware-in-the-loop (PHIL) facilities and experience gained in testing laboratory prototypes. The benefits of subjecting equipment to simulated environments include increased flexibility in designing, implementing, and executing experiments that reflect situations as close as possible to real world conditions. Individual test scenarios can be quickly configured and adapted once the device under test is connected, as only changes in software models need to be accommodated. Consequently, the required time and financial expenses associated with experimentation and testing are reduced. Further, the risk of late and costly changes due to specifications and design choices can be avoided as thorough and realistic tests can be performed earlier in the development cycle and before actual installation and deployment in the field. And, PHIL testing reveals how equipment will interact with the system for which it is being targeted in a way that more conventional non-interactive testing approaches cannot. As an example, the described PHIL capabilities can be used to derisk technology envisioned for realizing smart(er) grids.
Keywords :
power system simulation; smart power grids; testing; PHIL facility; laboratory prototype testing; noninteractive testing approach; power hardware-in-the-loop facility; smart grid; software model; Computational modeling; Generators; Load modeling; Marine vehicles; Real time systems; Synchronous motors; Testing;
Conference_Titel :
IECON 2011 - 37th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-61284-969-0
DOI :
10.1109/IECON.2011.6119916