DocumentCode :
2881310
Title :
Non-Conductive Films (NCFs) with Multi-Functional Epoxies and Silica Fillers for Reliable NCFs Flip Chip On Organic Boards (FCOB)
Author :
Chung, Chang-Kyu ; Paik, Kyung-Wook
Author_Institution :
Korea Adv. Inst. of Sci. & Technol., Daejon
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1831
Lastpage :
1838
Abstract :
Non-conductive films (NCFs) have become one of the promising interconnection adhesives for flip-chip assembly. Because NCFs have many advantages such as low cost, easy handling, and fine pitch application. However, effects of the material properties of NCFs on the reliability of NCFs flip-chip assemblies have not been fully understood. In this paper, effects of multi-functional epoxy and the addition of silica fillers on thermo-mechanical properties of cured NCFs and thermal cycling reliability of NCFs flip-chip-on-organic board (FCOB) assemblies were investigated. For the NCF materials, two kinds of thermosetting polymers, di-functional and multi-functional epoxies, and silica fillers of various contents (0 wt%, 10 wt%, and 20 wt%) were used. The curing behavior and thermo-mechanical properties of NCFs were measured for the NCF materials characterization. According to the results, NCFs using multi-functional epoxy had higher glass transition temperature (Tg), lower coefficient of thermal expansion (CTE), and higher storage modulus (E´) in high temperature region than NCFs using difunctional epoxy. And, as the silica filler content increased, the CTE and storage modulus of cured NCFs deceased and increased respectively. Thermal cycling test (-40 degC ~ 150 degC, 1000 cycles) was performed to investigate effects of thermo-mechanical properties of cured NCFs on thermal cycling reliability of NCFs FCOB assemblies. After 1000 cycles, scanning acoustic microscopy (SAM) and scanning electron microscopy (SEM) were used to detect delaminations and voids in test assemblies. According to the results, NCFs FCOB assemblies using NCFs with multi-functional epoxy had better thermal cycling reliability than those using NCFs with di-functional epoxy. And 10 wt% and 20 wt% silica added NCFs showed the best thermal cycling reliability in the electro-plated Au bump application and the stud Au bump application respectively. Consequently, thermo-mechanical properties of NCFs- , especially Tg, should be improved and the amount of added silica fillers should be optimized for high thermal cycling reliability of NCFs FCOB assemblies.
Keywords :
acoustic microscopy; assembling; curing; delamination; flip-chip devices; glass transition; gold; plastic packaging; polymers; scanning electron microscopy; silicon compounds; thermal expansion; thermal management (packaging); thermomechanical treatment; Au; Au bump; FCOB; NCF; SAM; SEM; delaminations; difunctional epoxies; flip chip on organic boards; glass transition temperature; multifunctional epoxies; nonconductive films; scanning acoustic microscopy; scanning electron microscopy; silica fillers; storage modulus; thermal cycling reliability; thermal expansion coefficient; thermo-mechanical properties; thermosetting polymers; voids; Acoustic testing; Assembly; Costs; Flip chip; Gold; Material properties; Scanning electron microscopy; Silicon compounds; Temperature; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.374046
Filename :
4250132
Link To Document :
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