• DocumentCode
    2881331
  • Title

    Embedded Computer System Integration Support

  • Author

    Phillips, Randy E. ; Thullen, Hark J.

  • Author_Institution
    TRW, Beavercreek, OH, USA
  • fYear
    1989
  • fDate
    22-26 May 1989
  • Firstpage
    616
  • Abstract
    The Embedded Computer System Integration Support (ECSIS) family of system integration support products has been targeted to meet the instrumentation requirement of the distributed avionics architectures currently evolving. This family of products provides basic stand-alone capabilities as well as simple expansion through the addition of other family members to a test configuration. Descriptions are given of the following processor and data bus monitor and control products: (1) X-TRAC, an embedded computer system (X) tool for real-time analysis and control; (2) X-PROBE, a user friendly window oriented monitor and control test operator interface; and (3) X-PIM, personality interface modules which provide the customer interface for the X-TRAC to individual processor and data bus targets
  • Keywords
    aerospace computing; aircraft instrumentation; automatic testing; computer interfaces; computer testing; computerised monitoring; distributed processing; local area networks; real-time systems; user interfaces; ECSIS family; Embedded Computer System Integration Support; TRW; X-PIM; X-PROBE; X-TRAC; control test operator interface; customer interface; data bus monitor/control products; distributed avionics architectures; instrumentation; local area networks; personality interface modules; processor; real time control; real-time analysis; stand-alone capabilities; test configuration; user friendly window oriented monitor; Aerospace electronics; Computer architecture; Computer interfaces; Computerized monitoring; Control systems; Distributed computing; Embedded computing; Instruments; Real time systems; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1989.40274
  • Filename
    40274