DocumentCode :
2881569
Title :
Novel Monolayer-enhanced Non-Conductive Film (NCF) for Ultra-Fine Pitch High Performance Interconnect in Lead-free Electronics
Author :
Li, Yi ; Yim, Myung Jin ; Wong, C.P.
Author_Institution :
Georgia Inst. of Technol., Atlanta
fYear :
2007
fDate :
May 29 2007-June 1 2007
Firstpage :
1911
Lastpage :
1915
Abstract :
With the aim of improving electrical properties of non-conductive film (NCF), two thiol (-SH) terminated -conjugated molecular wires are introduced into the interface of NCF. The conjugated molecular wires can be well assembled on the Au electrodes and improve the interfacial properties of the NCF joints. Biphenyldithiol (BPD) exhibits higher thermal stability after curing condition (150degC) than 1,4-benezenedithiol (BDT) due to the higher aromaticity (more aromatic rings) and thus more rigid structure. Formation of self-assembled monolayer on Au electrodes can tune the effective work function (Phi) of Au electrodes and reduce the tunnel resistivity. Therefore, the joint resistance of NCF joints, which is the sum of tunnel resistance and constriction resistance, can be significantly reduced from 0.15 times 10-3 Omega to 0.1 times 10-3 Omega and 0.05 times 10-3 Phi with BDT and BPD, respectively. The improved electrical conduction and current carrying capability enables the application of NCF in fine pitch and high performance interconnects in microelectronics.
Keywords :
conductive adhesives; curing; fine-pitch technology; gold; integrated circuit interconnections; monolayers; thermal stability; wires (electric); 1,4-benezenedithiol; Au; biphenyldithiol; conjugated molecular wires; curing condition; gold electrodes; high performance interconnect; lead-free electronics; microelectronics; monolayer enhanced nonconductive film; self-assembled monolayer; temperature 150 C; thermal stability; tunnel resistance; ultra-fine pitch interconnect; Assembly; Conductivity; Curing; Electric resistance; Electrodes; Environmentally friendly manufacturing techniques; Gold; Microelectronics; Thermal stability; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location :
Reno, NV
ISSN :
0569-5503
Print_ISBN :
1-4244-0985-3
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2007.374060
Filename :
4250146
Link To Document :
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