• DocumentCode
    2881569
  • Title

    Novel Monolayer-enhanced Non-Conductive Film (NCF) for Ultra-Fine Pitch High Performance Interconnect in Lead-free Electronics

  • Author

    Li, Yi ; Yim, Myung Jin ; Wong, C.P.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    1911
  • Lastpage
    1915
  • Abstract
    With the aim of improving electrical properties of non-conductive film (NCF), two thiol (-SH) terminated -conjugated molecular wires are introduced into the interface of NCF. The conjugated molecular wires can be well assembled on the Au electrodes and improve the interfacial properties of the NCF joints. Biphenyldithiol (BPD) exhibits higher thermal stability after curing condition (150degC) than 1,4-benezenedithiol (BDT) due to the higher aromaticity (more aromatic rings) and thus more rigid structure. Formation of self-assembled monolayer on Au electrodes can tune the effective work function (Phi) of Au electrodes and reduce the tunnel resistivity. Therefore, the joint resistance of NCF joints, which is the sum of tunnel resistance and constriction resistance, can be significantly reduced from 0.15 times 10-3 Omega to 0.1 times 10-3 Omega and 0.05 times 10-3 Phi with BDT and BPD, respectively. The improved electrical conduction and current carrying capability enables the application of NCF in fine pitch and high performance interconnects in microelectronics.
  • Keywords
    conductive adhesives; curing; fine-pitch technology; gold; integrated circuit interconnections; monolayers; thermal stability; wires (electric); 1,4-benezenedithiol; Au; biphenyldithiol; conjugated molecular wires; curing condition; gold electrodes; high performance interconnect; lead-free electronics; microelectronics; monolayer enhanced nonconductive film; self-assembled monolayer; temperature 150 C; thermal stability; tunnel resistance; ultra-fine pitch interconnect; Assembly; Conductivity; Curing; Electric resistance; Electrodes; Environmentally friendly manufacturing techniques; Gold; Microelectronics; Thermal stability; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.374060
  • Filename
    4250146