Title :
A programmable 80ns 1Mb CMOS EPROM
Author :
Saito, Sakuyoshi ; Tanaka, Shoji ; Atsumi, S. ; Yoshikawa, Kenichi ; Sato, Mitsuhisa ; Makita, Kikuo ; Mori, Shinsuke ; Nozawa, H. ; Iizuka, Tetsuya
Author_Institution :
Toshiba Semiconductor Device Engineering Lab, Kawasaki, Japan
Keywords :
CMOS memory circuits; CMOS technology; Circuit testing; Delay lines; Detectors; EPROM; Frequency; Pulse circuits; Read-write memory; Termination of employment;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1985 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1985.1156767
