Title :
Analysis of cross-correlation detector for passive radar applications
Author :
Jun Liu ; Hongbin Li ; Himed, Braham
Author_Institution :
Dept. of Electr. & Comput. Eng., Stevens Inst. of Technol., Hoboken, NJ, USA
Abstract :
For passive radar target detection, the cross-correlation (CC) based detector is a popular method, which cross-correlates the signal received in a reference channel (RC) and the signal in a surveillance channel (SC). The CC is simple to implement and resembles the optimum matched filter (MF) in idealistic conditions. However, there is limited understanding on its performance in realistic passive sensing environments with non-negligible noise in the RC and direct-path interference in the SC. This paper examines such effects on the detection performance of the CC detector. First, closed-form expressions for the probabilities of false alarm and detection of the CC detector are derived by using a central limit theory based approximation, which are verified with Monte Carlo simulations. Then, we show analytically to what extent the noise in the RC and the direct-path interference in the SC should be suppressed in order to achieve a desired performance loss of the CC detector with respect to the MF. These results are useful in designing practical CC solutions for passive radar sensing.
Keywords :
Monte Carlo methods; approximation theory; matched filters; object detection; passive radar; probability; radar detection; radar interference; radar signal processing; signal denoising; CC based detector; MF; Monte Carlo simulations; RC; SC; central limit theory based approximation; closed-form expressions; cross-correlation detector analysis; direct-path interference; optimum matched filter; passive radar sensing; passive radar target detection; performance loss; probability of false alarm; realistic passive sensing environments; reference channel; surveillance channel; Detectors; Interference; Passive radar; Signal to noise ratio; Sonar navigation;
Conference_Titel :
Radar Conference (RadarCon), 2015 IEEE
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4799-8231-8
DOI :
10.1109/RADAR.2015.7131100