Title :
Short circuit behaviour of IGBTs and their protection
Author :
Taylor, Brian E.
Author_Institution :
Int. Rectifier Corp., El Segundo, CA, USA
Abstract :
Insulated Gate Bipolar Transistor (IGBT) modules, when first introduced, were of the low gain, low efficiency variety which were also endowed with a similar capability to that of the BJT module. A consequence of this availability from the slower devices, was the same requirement being expected of newer high gain, high efficiency devices; although the devices themselves were not in need of such enhancement. Their in-built speed meant fault protection could usually be initiated as soon as the fault occured. Design engineers, however, deemed that short-circuit withstand capability was still a requirement; this has now duly been fabricated into the devices
Keywords :
insulated gate bipolar transistors; power transistors; protection; IGBTs; fault protection; high efficiency devices; in-built speed; semiconductor device protection; short circuit behaviour; short-circuit withstand capability;
Conference_Titel :
Devices, Drive Circuits and Protection, IEE Colloquium on
Conference_Location :
London