• DocumentCode
    288188
  • Title

    Short circuit behaviour of IGBTs and their protection

  • Author

    Taylor, Brian E.

  • Author_Institution
    Int. Rectifier Corp., El Segundo, CA, USA
  • fYear
    1994
  • fDate
    34449
  • Firstpage
    42430
  • Lastpage
    42433
  • Abstract
    Insulated Gate Bipolar Transistor (IGBT) modules, when first introduced, were of the low gain, low efficiency variety which were also endowed with a similar capability to that of the BJT module. A consequence of this availability from the slower devices, was the same requirement being expected of newer high gain, high efficiency devices; although the devices themselves were not in need of such enhancement. Their in-built speed meant fault protection could usually be initiated as soon as the fault occured. Design engineers, however, deemed that short-circuit withstand capability was still a requirement; this has now duly been fabricated into the devices
  • Keywords
    insulated gate bipolar transistors; power transistors; protection; IGBTs; fault protection; high efficiency devices; in-built speed; semiconductor device protection; short circuit behaviour; short-circuit withstand capability;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Devices, Drive Circuits and Protection, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    369826