Title :
Non-invasive measurement of MMICs using electro-optic techniques from 100 MHz-60 GHz
Author :
Dudley, R.A. ; Rodríguez-Llorente, F. ; Roddie, A.G.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Abstract :
We present recent advances in the NPL electro-optic sampling system for the on-wafer characterisation of microwave integrated circuits. Details of the system capabilities for S-parameter measurement and electric field profiling on coplanar waveguide and microstrip structures are described for frequencies up to 60 GHz
Keywords :
integrated circuit measurement; 100 MHz to 60 GHz; MMICs; NPL electro-optic sampling system; S-parameter measurement; coplanar waveguide; electric field profiling; electro-optic techniques; microstrip structures; noninvasive measurement; on-wafer characterisation;
Conference_Titel :
Microwave Measurements: Current Techniques and Trends (Ref. No. 1999/008), IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19990027
