• DocumentCode
    2882103
  • Title

    Optoelectronic time domain reflectometry

  • Author

    Smith, Andrew J A ; Woolliams, Peter D. ; Roddie, Alan G.

  • Author_Institution
    Centre for Electromagn. Metrol., Nat. Phys. Lab., Teddington, UK
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    42491
  • Lastpage
    42496
  • Abstract
    Demonstrates optoelectronic time domain reflectometry using two optoelectronic pulse generator systems. The use of LT-GaAs and electro-optical sampling (EOS) provides significantly better time resolution than conventional techniques. Direct comparison of results using pulses with conventional techniques using steps is discussed. In the future we will be investigating specially designed circuits with reflection artefacts to test the limitations of the technique
  • Keywords
    optical time-domain reflectometry; electro-optical sampling; optoelectronic pulse generator systems; optoelectronic time domain reflectometry; reflection artefacts; time resolution;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Microwave Measurements: Current Techniques and Trends (Ref. No. 1999/008), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19990028
  • Filename
    771831
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2882103