Title :
Optoelectronic time domain reflectometry
Author :
Smith, Andrew J A ; Woolliams, Peter D. ; Roddie, Alan G.
Author_Institution :
Centre for Electromagn. Metrol., Nat. Phys. Lab., Teddington, UK
Abstract :
Demonstrates optoelectronic time domain reflectometry using two optoelectronic pulse generator systems. The use of LT-GaAs and electro-optical sampling (EOS) provides significantly better time resolution than conventional techniques. Direct comparison of results using pulses with conventional techniques using steps is discussed. In the future we will be investigating specially designed circuits with reflection artefacts to test the limitations of the technique
Keywords :
optical time-domain reflectometry; electro-optical sampling; optoelectronic pulse generator systems; optoelectronic time domain reflectometry; reflection artefacts; time resolution;
Conference_Titel :
Microwave Measurements: Current Techniques and Trends (Ref. No. 1999/008), IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19990028
