DocumentCode :
2882518
Title :
Wafer level CSP process by VPES (vacuum printing encapsulation systems)
Author :
Okuno, Atsushi
Author_Institution :
Japan Rec Co. Ltd., Osaka, Japan
fYear :
2000
fDate :
2000
Firstpage :
143
Lastpage :
151
Abstract :
BGA and CSP markets are increasing, but these technologies use plastic or ceramic substrates as interposers, and the packaging size is really larger than chip size. Recently, wafer level CSP as extremity packaging has been introduced. This packaging method starts with the transfer molding method. However, transfer molding of epoxy resin can cause large warpage due to thermal expansion mismatch between wafer and insulating layer after molding, and reliability is poor. In this paper, we developed low cost and high reliability wafer level CSP packaging. We developed very low warpage, low expansion, high adhesive strength, and high purity encapsulating liquid epoxy resin. The coating method used VPES (vacuum printing encapsulation systems) to produce void-free packaging. VPES is very suitable for large scale production. We achieved low cost and high reliability wafer level CSPs as extremity packaging with a good combination of low warpage epoxy resin and VPES
Keywords :
chip scale packaging; deformation; encapsulation; integrated circuit interconnections; integrated circuit reliability; moulding; plastic packaging; polymer films; thermal expansion; thermal stresses; vacuum techniques; BGA market; CSP market; VPES; adhesive strength; ceramic substrate interposers; coating method; encapsulating liquid epoxy resin; epoxy resin; extremity packaging; insulating layer; molding; packaging method; packaging size; plastic substrate interposers; purity; reliability; thermal expansion mismatch; transfer molding; vacuum printing encapsulation systems; void-free packaging; wafer level CSP; wafer level CSP packaging; wafer level CSP process; wafer level CSPs; warpage; Ceramics; Chip scale packaging; Costs; Encapsulation; Epoxy resins; Extremities; Plastics; Printing; Transfer molding; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2000. (EMAP 2000). International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6654-9
Type :
conf
DOI :
10.1109/EMAP.2000.904144
Filename :
904144
Link To Document :
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