DocumentCode :
2882679
Title :
Whole-vehicle susceptibility correlation with laboratory test techniques
Author :
Williams, Daniel L. ; Idoguchi, Masaru ; McGinnis, William H.
Author_Institution :
Southwest Research Institute P. O. Drawer 28510, San Antonio, TX 78228-0510
fYear :
1992
fDate :
17-21 Aug. 1992
Firstpage :
214
Lastpage :
218
Keywords :
Current measurement; Electromagnetic compatibility; Electronic equipment testing; Laboratories; Performance evaluation; Probes; Radio frequency; System testing; TEM cells; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1992. Symposium Record., IEEE 1992 International Symposium on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-0713-5
Type :
conf
DOI :
10.1109/ISEMC.1992.626080
Filename :
626080
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2882679
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