DocumentCode :
2882724
Title :
VLSI & Mobility
Author :
Thuillier, Bruno
fYear :
2006
fDate :
26-28 April 2006
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. Mobile phone baseband, power management unit and RF integration is an area of expanding interest within the semiconductor industry as it enables highly integrated solution and hence has the capability to address mobile phone fragmentation in ultra low cost, mid and high end areas. This paper presents the progress, limits and challenges of integration in relation with mobility. Some suggestions regarding potential directions are included. VLSI design, automation and testing progress may help to further improve new features integration flexibility, application speed and power consumption optimization
Keywords :
VLSI; integrated circuit design; integrated circuit testing; mobile handsets; RF integration; VLSI design; VLSI testing; mobile phone baseband; mobile phone fragmentation; power management unit; semiconductor industry; Automatic testing; Baseband; Costs; Design automation; Electronics industry; Energy consumption; Energy management; Mobile handsets; Radio frequency; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2006 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0179-8
Electronic_ISBN :
1-4244-0180-1
Type :
conf
DOI :
10.1109/VDAT.2006.258108
Filename :
4027480
Link To Document :
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