A simple method of characterizing high-frequency inductors under large excitation

Author

Sasada, Ichiro ; Takigawa, Tomohiro

Author_Institution

Dept. of Electron., Kyushu Univ., Fukuoka, Japan

fYear

1994

fDate

20-25 Jun 1994

Firstpage

872

Abstract

A simple method is presented by which high-frequency inductors can be characterized under large excitation by using a general-purpose digital oscilloscope. The method uses numerical multiplication to measure phase difference between two sinusoidal waveforms from which L and Q are calculated using the phase diagram relationship. Factors affecting accuracy of the method are analyzed based on the sensitivity function. A method is also presented by which influences of parasitic elements across a current sensing resistor can be removed. The accuracy of the method is evaluated by characterizing an air-core inductor (10.1 μH) which is easily characterized by an impedance analyzer. Inductance and quality-factor (≃100) at 1 MHz were measured in good accuracy. Planar inductors using NiZn ferrite substrates are characterized at 1 MHz by this method

Keywords

Q-factor; cores; electric impedance; inductance measurement; inductors; oscilloscopes; phase measurement; 1 MHz; NiZn ferrite substrates; air-core inductor; current sensing resistor; digital oscilloscope; excitation; high-frequency inductors; impedance analyzer; inductance; numerical multiplication; parasitic elements; phase diagram relationship; phase difference measurement; quality-factor; sensitivity function; sinusoidal waveforms; Electrical resistance measurement; Frequency; Impedance; Inductance measurement; Inductors; Oscilloscopes; Phase measurement; Q measurement; Resistors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Electronics Specialists Conference, PESC '94 Record., 25th Annual IEEE

Conference_Location

Taipei

Print_ISBN

0-7803-1859-5

Type

conf

DOI

10.1109/PESC.1994.373781

Filename

373781