Title :
Chaos In Phase Locked Loop
Author_Institution :
Analog Circuit Design Div, MediaTek Inc., Hsin-Chu
Abstract :
We prove existence of chaos in phase locked loop (PLL). It is the first time that border-collision bifurcations and chaotic phenomenon in digital charge pump PLL is reported. The numerical result of behavior model is also presented to explain why the chaotic phenomenon exists in PLL. Moreover we highlight that the same chaotic phenomenon will exist in general sample hold feedback circuits
Keywords :
chaos; circuit feedback; digital phase locked loops; border-collision bifurcations; chaos; chaotic phenomenon; digital charge pump PLL; phase locked loop; sample hold feedback circuits; Bifurcation; Chaos; Charge pumps; Equations; Feedback circuits; Filters; Frequency; Numerical simulation; Phase locked loops; Tellurium;
Conference_Titel :
VLSI Design, Automation and Test, 2006 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0179-8
Electronic_ISBN :
1-4244-0180-1
DOI :
10.1109/VDAT.2006.258110
