Title :
A 15ns 64K bipolar SRAM
Author :
Heald, R. ; Herndon, W. ; In-Nan Wu ; Si-Yu Chen
Author_Institution :
Fairchild Advanced Research, Palo Alto, CA, USA
Keywords :
Capacitance; Circuits; Diodes; Error analysis; Random access memory; Read-write memory; Resistors; Silicides;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1985 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1985.1156835
