Title :
Measurement of linewidth enhancement factor variations in external cavity semiconductor lasers
Author :
Giuliani, Guido ; Donati, Silvano ; Elssser, W.
Author_Institution :
Dipartimento di Elettronica, Pavia Univ., Italy
Abstract :
This paper deals with linewidth enhancement factor measurements performed with a new method based on the self-mixing optical feedback interference effect capable of measuring the α value in operating conditions above threshold. Measurements are performed on a commercial ECL in Littman configuration, emitting 40 mW maximum power, with wavelength tunable between 830 and 870 nm.
Keywords :
laser cavity resonators; laser feedback; laser tuning; semiconductor lasers; spectral line breadth; 40 mW; 830 to 870 nm; Littman configuration; commercial ECL; external cavity lasers; linewidth enhancement factor; optical feedback interference effect; self-mixing effect; semiconductor lasers; tunable wavelength; Gratings; Laser feedback; Laser noise; Laser sintering; Optical feedback; Optical materials; Performance evaluation; Postal services; Semiconductor lasers; Wavelength measurement;
Conference_Titel :
Quantum Electronics Conference, 2005. EQEC '05. European
Print_ISBN :
0-7803-8973-5
DOI :
10.1109/EQEC.2005.1567186
