Title :
Monolithic Class E SiGe Power Amplifier Design with Wideband High-Efficiency and Linearity
Author :
Lie, Donald Y C ; Popp, Jeremy D. ; Lee, Patrick ; Yang, Annie H. ; Rowlando, Jason F. ; Wang, F. ; Kimball, Don
Author_Institution :
Dynamic Res. Corp., San Diego, CA
Abstract :
This paper discusses and compares the design of monolithic RF broadband class E SiGe power amplifiers (PAs) centered at 900MHz that are highly efficient and linear. It is found that high power-added-efficiency (~65%) can be achieved with PAs designed using either high-breakdown or high-fT SiGe transistors. The PAs designed with high-breakdown devices can provide ~3% better efficiency at higher supply voltages but with worse bias sensitivity, inferior broadband frequency response, and slightly lower gain than those designed with high-fT devices. However, the class E PAs designed using high-breakdown devices can be successfully linearized using an open-loop envelope tracking (ET) technique as their output spectra pass the stringent EDGE transmit mask with margins, achieving an overall system PAE of 44.4% that surpasses the ~30% PAE obtainable using commercial GaAs class AB PAs. These promising results indicate the feasibility of realizing true single-chip wireless transceivers with on-chip RF SiGe PAs for spectrally-efficient non-constant-envelope modulation schemes
Keywords :
Ge-Si alloys; III-V semiconductors; MMIC power amplifiers; UHF power amplifiers; gallium arsenide; integrated circuit design; 900 MHz; GaAs; RF power amplifiers; SiGe; high-breakdown devices; monolithic class E power amplifier design; nonconstant envelope modulation schemes; open-loop envelope tracking technique; single-chip wireless transceivers; Broadband amplifiers; Frequency response; Gallium arsenide; Germanium silicon alloys; High power amplifiers; Linearity; Radio frequency; Radiofrequency amplifiers; Silicon germanium; Voltage;
Conference_Titel :
VLSI Design, Automation and Test, 2006 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0179-8
Electronic_ISBN :
1-4244-0180-1
DOI :
10.1109/VDAT.2006.258128