Title :
Probing strain propagation in nanostructured perovskites by ultrafast x-ray diffraction
Author :
Schmising, C. V Kor-« ; Bargheer, M. ; Kiel, M. ; Zhavoronkov, N. ; Woerner, M. ; Elsaesser, T. ; Vrejoiu, I. ; Hesse, D. ; Alexe, M.
Author_Institution :
Max-Born-Inst. fur Nichtlineare Opt. und Kurzzeitspektroskopie, Berlin
Abstract :
Propagating strain waves in SrTiO3 with amplitudes of Deltaa(t)/a0 ap 10-4 launched from a PbZr0.2Ti0.8O3 film are measured by X-ray diffraction. The shape of the picosecond transients depends nonlinearly on the strain amplitude due to X-ray interference.
Keywords :
X-ray diffraction; high-speed optical techniques; lead compounds; nanostructured materials; strontium compounds; wave propagation; zirconium compounds; PbZr0.2Ti0.8O3; SrTiO3; X-ray interference; nanostructured perovskites; picosecond transients; probing strain propagation; strain wave propagation; ultrafast X-ray diffraction; Capacitive sensors; Interference; Lattices; Optical films; Optical reflection; Reflectivity; Strain measurement; Substrates; Ultrafast optics; X-ray diffraction; (320.7130) Ultrafast processes in condensed matter; (340.7480) X-rays;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4628952
