• DocumentCode
    2883346
  • Title

    Cycle-accurate Verification of AHB-based RTL IP with Transaction-level System Environment

  • Author

    Shim, Heejun ; Lee, Sang-Heon ; Woo, Yun-Sik ; Chung, Moo-Kyoung ; Lee, Jae-Gon ; Kyung, Chong-Min

  • Author_Institution
    Dept. of EECS, Korea Adv. Inst. of Sci. & Technol., Daejeon
  • fYear
    2006
  • fDate
    26-28 April 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents cycle-accurate mixed-level simulation and acceleration method. This enables us to utilize transaction-level test vectors which are usually already implemented in early design steps and which are also easy to generate than HDL test vectors, to verify RTL design. As there is no commercial simulation environment that can efficiently handle transaction-level and RTL models at the same time, we employed two simulators for each abstraction-level modeling. To translate abstraction levels of communication between the two simulators, we implemented transactor that is inserted between them. This paper shows the principle of operation of the transactor focusing on the synchronization between transaction-level simulator and RTL simulator. In addition, we replaced RTL simulator with hardware accelerator to improve simulation performance. We implemented wrapper for hiding access routines of hardware acceleration from transaction-level simulator which is attached to the above mentioned transactor
  • Keywords
    circuit simulation; formal verification; integrated circuit modelling; logic design; AHB-based RTL IP; RTL design; RTL simulator; abstraction-level modeling; acceleration method; cycle-accurate verification; mixed-level simulation; transaction-level simulator; transaction-level system; transaction-level test vectors; Acceleration; Circuit simulation; Delay; Embedded system; Hardware design languages; Integrated circuit modeling; Master-slave; Performance analysis; Software performance; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2006 International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    1-4244-0179-8
  • Electronic_ISBN
    1-4244-0180-1
  • Type

    conf

  • DOI
    10.1109/VDAT.2006.258143
  • Filename
    4027515