DocumentCode :
2883357
Title :
Spectroscopic analysis of foil plasmas on a 1-MA Linear Transformer Driver
Author :
Patel, S.G. ; Gilgenbach, R.M. ; Zier, J.C. ; Chalenski, D.A. ; Gomez, M.R. ; Steiner, A.M. ; French, D.M. ; Weis, M. ; Lau, Y.Y.
Author_Institution :
Nucl. Eng. & Radiol. Sci. Dept., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2011
fDate :
26-30 June 2011
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. Spectroscopic analysis has been performed on Al foil plasmas ablated by the Linear Transformer Driver (LTD) at the University of Michigan. The MAIZE LTD can supply 1-MA, 100 kV pulses with 100 ns risetime into a matched load. The plasma load used in this experiment consists of a 400 nm Al foil (cathode) placed between two, planar, current return anode posts. The LTD was charged to +-70 kV, resulting in approximately 0.65 MA with a 170 ns risetime passing through the foil. An optical fiber was placed about 1 cm away from the load; plasma light passed through a 0.75-m optical spectrograph and was gated for 10 ns by an intensified CCD detector. The density of the edge plasma can be determined through Stark broadening of the H-alpha line. The Fourier transform was taken of the Voigt profile, which was then used to approximate the density of the Al plasma. This method resulted in a density of approximately 1015 cm-3 in the outer regions of the Al plasma at peak current. Additionally, spectra taken during the current rise yielded 1-3-eV plasma temperatures from the slope of the continuum emission. These data will be shown as well as planned future experiments.
Keywords :
Stark effect; aluminium; plasma boundary layers; plasma density; plasma diagnostics; plasma transport processes; spectral line breadth; spectral line broadening; transformers; Al; Fourier transform; H-alpha line analysis; Stark broadening; Voigt profile; continuum emission process; current 1 MA; edge plasma density; foil plasma spectroscopic analysis; intensified CCD detector; linear transformer driver; optical fiber; optical spectrograph; plasma temperature; time 100 ns; voltage 100 kV; Detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science (ICOPS), 2011 Abstracts IEEE International Conference on
Conference_Location :
Chicago, IL
ISSN :
0730-9244
Print_ISBN :
978-1-61284-330-8
Electronic_ISBN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2011.5993196
Filename :
5993196
Link To Document :
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