Title :
Alpha particle effects on bipolar ECL static arrays
Author :
Voldman, Steven ; Patrick, L. ; Wong, D.
Author_Institution :
IBM General Technology Division, Essex Junction, VT, USA
Abstract :
This paper will discuss results obtained between experimental studies and circuit simulation of the soft error rates versus critical charge in static bipolar ECL memory arrays. Design optimization and process innovation was used to achieve failure rates below 0.1 fails/bit/Khr with critical charge exceeding 300fC.
Keywords :
Alpha particles; Emergency power supplies; Error analysis; Error correction; Isolation technology; Logic; Passivation; Radiation effects; Semiconductor materials; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1985 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1985.1156869
