Title :
Neural network Bayes error estimation
Author :
Martin, Curtis E. ; Rogers, Steven K. ; Ruck, Dennis W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wright Res. & Dev. Center, Wright-Patterson AFB, OH, USA
fDate :
27 Jun-2 Jul 1994
Abstract :
A neural network approach to obtaining upper and lower bounds on the Bayes error rate for pattern recognition problems is presented. The approach is developed using the key concept of resubstitution and leave-one-out testing from conventional nonparametric error estimation techniques. The neural network approach is evaluated by applying it to several eight-dimensional, two-class “toy” problems, where the Bayes error rate is known. The upper bound of the Bayes error rate is reliably found for problems with complex decision boundary surfaces. Alternative testing approaches are suggested for reducing the difference between the bounds and the true Bayes rate
Keywords :
Bayes methods; error analysis; multilayer perceptrons; pattern recognition; Bayes error rate; conventional nonparametric error estimation techniques; eight-dimensional two-class toy problems; leave-one-out testing; neural network Bayes error estimation; neural network approach; pattern recognition problems; resubstitution; Benchmark testing; Density functional theory; Density measurement; Error analysis; Estimation theory; Multilayer perceptrons; Neural networks; Pattern recognition; Probability density function; Upper bound;
Conference_Titel :
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-1901-X
DOI :
10.1109/ICNN.1994.374180