Title :
The HOY Tester-Can IC Testing Go Wireless?
Author :
Wu, Cheng-Wen ; Huang, Chih-Tsun ; Huang, Shi-Yu ; Huang, Po-Chiun ; Chang, Tsin-Yuan ; Hsing, Yu-Tsao
Author_Institution :
Dept. of Electr. Eng., National Tsing Hua Univ., Hsinchu
Abstract :
Test cost is becoming a more and more significant portion of the cost structure in advanced semiconductor products. To address this issue, we propose HOY - a novel wireless test system with enhanced embedded test features. We present the concept, architecture, and test flow for future semiconductor products tested by HOY. Necessary technologies for the success of HOY also are presented, though most of which require further investigation. A preliminary demonstration system has been constructed, and experiments are being conducted
Keywords :
integrated circuit testing; HOY tester; integrated circuit testing; semiconductor products; wireless test system; Automatic testing; Built-in self-test; Circuit testing; Costs; Fabrication; Frequency; Integrated circuit testing; Probes; Semiconductor device testing; System testing;
Conference_Titel :
VLSI Design, Automation and Test, 2006 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0179-8
Electronic_ISBN :
1-4244-0180-1
DOI :
10.1109/VDAT.2006.258155
