• DocumentCode
    2883569
  • Title

    Electrostatic discharge in semiconductor devices: overview of circuit protection techniques

  • Author

    Vinson, J.E. ; Liou, J.J.

  • Author_Institution
    Intersil Corp., Palm Bay, FL, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    5
  • Lastpage
    8
  • Abstract
    Electrostatic discharges (ESD) are prevalent. These events damage sensitive electronic components causing system failures. Designers are not helpless against this event. There are ways to provide protection for these electronic devices. This paper provides an overview of the additional elements placed on the circuit to divert charge and clamp voltages. Both the protection architectures and clamps used are reviewed
  • Keywords
    electrostatic discharge; overvoltage protection; semiconductor device reliability; charged device model; circuit protection techniques; electrostatic discharge; human body model; machine model; semiconductor devices; static clamps; transient clamps; Biological system modeling; Circuit testing; Clamps; Electronic components; Electrostatic discharge; Humans; Protection; Robustness; Semiconductor devices; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2000. Proceedings. 2000 IEEE Hong Kong
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-6304-3
  • Type

    conf

  • DOI
    10.1109/HKEDM.2000.904204
  • Filename
    904204