DocumentCode :
2883569
Title :
Electrostatic discharge in semiconductor devices: overview of circuit protection techniques
Author :
Vinson, J.E. ; Liou, J.J.
Author_Institution :
Intersil Corp., Palm Bay, FL, USA
fYear :
2000
fDate :
2000
Firstpage :
5
Lastpage :
8
Abstract :
Electrostatic discharges (ESD) are prevalent. These events damage sensitive electronic components causing system failures. Designers are not helpless against this event. There are ways to provide protection for these electronic devices. This paper provides an overview of the additional elements placed on the circuit to divert charge and clamp voltages. Both the protection architectures and clamps used are reviewed
Keywords :
electrostatic discharge; overvoltage protection; semiconductor device reliability; charged device model; circuit protection techniques; electrostatic discharge; human body model; machine model; semiconductor devices; static clamps; transient clamps; Biological system modeling; Circuit testing; Clamps; Electronic components; Electrostatic discharge; Humans; Protection; Robustness; Semiconductor devices; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2000. Proceedings. 2000 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6304-3
Type :
conf
DOI :
10.1109/HKEDM.2000.904204
Filename :
904204
Link To Document :
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