DocumentCode
2883569
Title
Electrostatic discharge in semiconductor devices: overview of circuit protection techniques
Author
Vinson, J.E. ; Liou, J.J.
Author_Institution
Intersil Corp., Palm Bay, FL, USA
fYear
2000
fDate
2000
Firstpage
5
Lastpage
8
Abstract
Electrostatic discharges (ESD) are prevalent. These events damage sensitive electronic components causing system failures. Designers are not helpless against this event. There are ways to provide protection for these electronic devices. This paper provides an overview of the additional elements placed on the circuit to divert charge and clamp voltages. Both the protection architectures and clamps used are reviewed
Keywords
electrostatic discharge; overvoltage protection; semiconductor device reliability; charged device model; circuit protection techniques; electrostatic discharge; human body model; machine model; semiconductor devices; static clamps; transient clamps; Biological system modeling; Circuit testing; Clamps; Electronic components; Electrostatic discharge; Humans; Protection; Robustness; Semiconductor devices; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2000. Proceedings. 2000 IEEE Hong Kong
Conference_Location
Hong Kong
Print_ISBN
0-7803-6304-3
Type
conf
DOI
10.1109/HKEDM.2000.904204
Filename
904204
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