Title :
Computer-aided design for VLSI
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana-Champaign, IL, USA
Abstract :
New CAD issues related to MOS VLSI and optoelectronic integration technologies are reviewed. Especially, new issues on performance and timing driven physical layout, design for VLSI manufacturability and reliability using time-efficient simulation technologies are discussed. In contrast, CAD issues in optoelectronics are presently at the device modeling and circuit simulation level. CAD environments that support fast turnaround model development and circuit verification are discussed with specific optical device models of semiconductor lasers, photodetectors and optical logic gates
Keywords :
MOS integrated circuits; VLSI; circuit CAD; circuit layout CAD; integrated optoelectronics; CAD issues; MOS VLSI; OEIC; circuit simulation; design for manufacturability; device modeling; optical device models; optical logic gates; optoelectronic integration; photodetectors; physical layout; reliability; semiconductor lasers; time-efficient simulation; Circuit simulation; Computational modeling; Design automation; Integrated circuit reliability; Laser modes; Optical devices; Semiconductor device manufacture; Timing; Very large scale integration; Virtual manufacturing;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184233
